Specific Exafs Tools in Analysis of MoSI Nanowires

 Alojz Kodre1,2, Jana Padežnik Gomilšek3, Iztok. Arčon 4,2, Anton Meden5 and Dragan Mihailović1,2,6

1Faculty of Mathematics and Physics, University of Ljubljana, Jadranska 19, SI–1000 Ljubljana, Slovenia
2J. Stefan Institute, Jamova 39, SI–1000 Ljubljana, Slovenia
3Faculty of Mechanical Engineering, University of Maribor, Smetanova 17, SI-2000 Maribor, Slovenia
4Nova Gorica Polytechnic, Vipavska 13, SI-5000 Nova Gorica, Slovenia
5Faculty of Chemistry and Chemical Technology, University of Ljubljana, Aškerčeva 5, SI-1000 Ljubljana  Slovenia
6 Mo6 d.o.o. Teslova 30, SI-1000 Ljubljana, Slovenia

The structure of nanowires prepared by vapor synthesis from Mo, S and I is investigated by methods of x-ray diffraction (XRD) and extended x-ray absorption fine structure (EXAFS). Starting with a qualitative model of the structure from XRD, the metrics is introduced with interatomic distances determined from EXAFS. Two specific tools to increase the resolution of EXAFS method are discussed: the reciprocity relation between data from adjacent target atoms, and difference EXAFS from data on samples with small changes in stoichiometry.

Key words: EXAFS, nanowires, molybdenum sulphide-iodide