The use of X-ray Crystallography to Determine Absolute Configuration (II)

Howard. D. Flack

Laboratoire de Cristallographie, University of Geneva, Switzerland
* Corresponding author: E-mail: crystal@flack.ch

Abstract
An update is provided to H. D. Flack and G. Bernardinelli, Chirality, 2008, 20, 681690 on The use of X-ray Crystallography to determine absolute configuration. In particular, comments are made about optical rotation, powder diffraction, the Bijvoet ratio and intensity measurements for single-crystal X-ray diffractometry.

Keywords: Absolute configuration, absolute structure, crystal structure, resonant scattering, X-ray