Detection of Deoxynivalenol in Wheat by Fourier Transform Infrared Spectroscopy†
Biljana Abramović1, Igor Jajić2, Borislav Abramović3,
Jasenka Ćosić4, Verica Jurić2
1 Faculty of Sciences, Department of Chemistry, Trg D. Obradovića
3, 21000 Novi Sad, Serbia
Phone: +38121 4852753, Fax: +38121454065
2 Faculty of Agriculture, Trg D. Obradovića 8, 21000 Novi Sad, Serbia
3 High technical School, Školska 1, 21000 Novi Sad, Serbia
4 Faculty of Agriculture in Osijek, Trg svetog Trojstva 3, Osijek,
Croatia
E-mail: abramovic@ih.ns.ac.yu
Abstract
The possibility of using two Fourier transform mid-infrared spectroscopic
techniques was investigated with the purpose of rapid detection of mycotoxin-producing
Fusarium fungi on wheat, as an indicator for the presence of the mycotoxin
deoxynivalenol (DON). Samples of a single wheat genotype (Monika, blanks and
contaminated with Fusarium graminearum) were ground and analyzed applying the
diffuse reflection (DR) and attenuated total reflection (ATR) modes. The
recorded spectra were evaluated with principal component analysis and the blank
and contaminated samples were classified by cluster analysis. Besides, the
possibility was examined of determining DON on the basis of the ratio of ATR
signals at 1709 cm–1 and 1743 cm–1. Reference measurements
were performed by high performance liquid chromatography with diode array
detection. The concentration range for contaminated samples was 2.51–12.14
mg/kg. Classification efficiency was 100% for ATR spectra, whereas DR spectra
did not show so obvious clustering of contaminated and blank samples. The ATR
technique appeared advantageous owing to its easier use and interpretation of
results, which were better in respect of classification and quantification.
Quantification using partial least squares (PLS1) regression, as well as
multiple linear regression (MLR) showed good correlation with DON reference data
for the mentioned wheat genotype.
Keywords: Fusarium fungi, attenuated total reflection, mid-infrared spectroscopy, wheat, mycotoxins, chemometrics.